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Scanning Probe Microscope
NT-MDT Ntegra Prima
- Manufacturer: NT-MDT, Russia
- Scanning regimes: by probe and by sample
- Mode: AFM (contact, semi-contact, contactless), LFM, MFM, EFM, ...
- Frequency: 5 MHz max.
- Scan range: 100 µm x 100 µm x 10 µm
- Additional Information: modular system, more than 40 measuring methods, low temperature drift